Automatic Test Data Generation
Selected Papers
- The Dynamic Domain Reduction Approach to Test Data Generation.
Jeff Offutt, Zhenyi Jin and Jie Pan.
Software-Practice and Experience,
29(2):167-193, January 1999.
[Abstract]
[PDF]
- Experimental Results from an Automatic Test Case Generator.
Rich DeMillo and Jeff Offutt.
ACM Transactions on Software Engineering Methodology,
2(2):109-175, April 1993.
- An Integrated Automatic Test Data Generation System.
Jeff Offutt.
Journal of Systems Integration,
1(3):391-409,
November 1991.
- Constraint-Based Automatic Test Data Generation,
Rich DeMillo and Jeff Offutt.
IEEE Transactions on Software Engineering,
17(9):900-910,
September 1991.
-
Automatic Test Data Generation,
Jeff Offutt.
PhD Dissertation,
Georgia Institute of Technology,
Atlanta GA,
August 1988.
Technical report GIT-ICS 88/28,
UMI AAD89-04822.
Chapters 1 through 5
Chapters 6 through 10
(Scanner could not handle all 91 pages.)
Other links
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